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2018 JEOL JSM-IT100 SEM - Scanning Electron Microscope
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For Sale: 2018 JEOL JSM-IT100 SEM - Scanning Electron Microscope
Complete and functional microscope out of downsizing research lab. Includes original PC, software, rough pump, chamber scope controller, cables and other accessories for SEM.
"Scope generated these actual images attached at 250x, 500x, 1000x and 3000x magnification."
EDS Detector is a Dry SD25 DETECTOR UNIT, PN: EX-74400U7S61
Type: Silicon-drift type
Detection element area 25mm²
Effective detection area17.5 mm²
Also has BACK SCATTERED ELECTRON DETECTOR PN: MP-04040BED installed
Filament type (JSM-IT100)
Tungsten hairpin filament (factory pre-centered).
Chamber accommodates up to a 150 mm diameter specimen (stage/holder dependent).
Max specimen diameter: 150 mm
Complete and functional microscope out of downsizing research lab. Includes original PC, software, rough pump, chamber scope controller, cables and other accessories for SEM.
"Scope generated these actual images attached at 250x, 500x, 1000x and 3000x magnification."
EDS Detector is a Dry SD25 DETECTOR UNIT, PN: EX-74400U7S61
Type: Silicon-drift type
Detection element area 25mm²
Effective detection area17.5 mm²
Also has BACK SCATTERED ELECTRON DETECTOR PN: MP-04040BED installed
Filament type (JSM-IT100)
Tungsten hairpin filament (factory pre-centered).
Chamber accommodates up to a 150 mm diameter specimen (stage/holder dependent).
Max specimen diameter: 150 mm
More Details
If you are interested, email us at sales@globaltechequipment.com.
Shipping:
- Equipment will be professionally crated in IPPC for safe arrival to your facility.
- International shipping is available. The buyer is responsible for any applicable taxes, duties, or import charges associated with the shipment.
